Experimental demonstration of interferometric imaging using photonic integrated circuits
نویسندگان
چکیده
منابع مشابه
Using Photonic Integrated Circuits
Contention resolution and forwarding of labeled optical packets at 40 Gb/s is demonstrated utilizing multiple InP based optical buffers and monolithic wavelength converters. Layer-2 packet recovery measurements are presented. ©2009 Optical Society of America OCIS codes: (060.1810) Buffers, couplers, routers, switches, and multiplexers; (060.6719) Switching, packet
متن کاملDemonstration of All-Optical NAND Logic Gate Using Photonic Integrated Circuits
A logic gate is a device that performs a certain Boolean logic operation on one or more logical inputs and produces a single logical output. The logic values are either "true or "false and are represented as 1 and 0, respectively. In other words Logic gates are bistable devices, that is, they may yield one of these two possible stable outputs. The relationship between the input logic and output...
متن کاملMicromechanical Photonic Integrated Circuits
The ability to integrate micro-optical elements with movable structures and microactuators has opened up many new opportunities for optical and optoelectronic systemsI2. It allows us to manipulate optical beams more effectively than conventional methods, and is scalable to large optical systems. Optical MEMS (MicroElectroMechanical Systems) have applications in display, sensing, and optical dat...
متن کاملPhotonic Integrated Circuits
Large-scale photonic integrated circuits (PICs) in Indium Phosphide represent a significant technology innovation that simplifies optical system design, reduces space and power consumption, and improves reliability. In addition, by lowering the cost of optical-to-electrical-to-optical (OEO) conversion in optical networks, they provide a transformational opportunity to embrace the use of electro...
متن کاملIntegrated Circuit Tester Using Interferometric Imaging
LLE Review, Volume 72 209 A noninvasive optical diagnostic technique for testing the electrical state of an integrated circuit has been developed at LLE. The interferometric probe is capable of distinguishing between the onand off-state of an N-channel field-effect transistor (FET) with micron-size dimensions. Continued development of advanced semiconductor devices relies on the availability of...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Optics Express
سال: 2017
ISSN: 1094-4087
DOI: 10.1364/oe.25.012653